发明名称 Transistor having a locally provided metal silicide region in contact areas and a method of forming the transistor
摘要 By performing a silicidation process on the basis of a patterned dielectric layer, such as an interlayer dielectric material, the respective metal silicide portions may be provided in a highly localized manner at the respective contact regions, while the overall amount of metal silicide may be significantly reduced. In this way, a negative influence of the stress of metal silicide on the channel regions of field effect transistors may be significantly reduced, while nevertheless maintaining a low contact resistance.
申请公布号 US7799682(B2) 申请公布日期 2010.09.21
申请号 US20070697890 申请日期 2007.04.09
申请人 GLOBALFOUNDRIES INC. 发明人 BEYER SVEN;PRESS PATRICK;FEUDEL THOMAS
分类号 H01L29/78 主分类号 H01L29/78
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