| 摘要 |
PURPOSE: A semiconductor memory testing device is provided to prevent various circuit components from being damaged by installing a cold/hot air generator on the side of a body. CONSTITUTION: A body(10) is mounted on various circuit components for testing a semiconductor memory. A jig unit(20) is installed on one side of the body and is mounted on the semiconductor memory. A cover(30) is movably mounted on the body and covers the jig unit. A cold/hot air generator(40) is mounted on the side of a body. |
