发明名称 Normal incidence ellipsometer with complementary waveplate rotating compensators
摘要 In embodiments of the present invention a second, different waveplate is introduced into a single rotating compensator normal incidence ellipsometer. The second waveplate provides a quarter wavelength retardation that is different from and complementary to that of the first waveplate in order to increase the spectral range for which useful retardation is available, especially towards the deep UV spectrum. The sensitivity for the system may also be increased in the conventional spectral range, since each of the two waveplates may be optimized for its own, somewhat more narrow spectral range of operation. With the proper choice of two waveplates of different retardation, the useful spectral range may be extended from typically 190-820 nm to 150-1000 nm, and beyond if necessary, while increasing the sensitivity within the conventional wavelength range at the same time.
申请公布号 US7889340(B1) 申请公布日期 2011.02.15
申请号 US20080170371 申请日期 2008.07.09
申请人 KLA-TENCOR CORPORATION 发明人 FLOCK KLAUS;FANTON JEFF T.
分类号 G01J4/00 主分类号 G01J4/00
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