发明名称 METHOD FOR FORMING CONFORMAL DIELECTRIC FILM HAVING Si-N COMBINATION BY PECVD
摘要 PROBLEM TO BE SOLVED: To provide a method which forms a conformal dielectric film having Si-N bonds on a semiconductor substrate by a plasma enhanced chemical vapor deposition (PECVD). SOLUTION: The method includes a step which introduces a nitrogen and hydrogen containing reaction gas and rare gas into a reaction space in which a semiconductor substrate positioned is placed, a step which applies an RF power into the reaction space, and a step which introduces a precursor containing a silicon gas with hydrogen into the reaction space in a state in which a pulse has a duration not longer than five sec, introduces the reaction gas and rare gas without interruption while the plasma is excited, thereby forming a conformal dielectric film having the Si-N bond on the substrate. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011054968(A) 申请公布日期 2011.03.17
申请号 JP20100193285 申请日期 2010.08.31
申请人 ASM JAPAN KK 发明人 LEE WOO JIN;SHIMIZU AKIRA
分类号 H01L21/318;C23C16/42;C23C16/509;H01L21/31 主分类号 H01L21/318
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