| 摘要 |
A method for detecting component defects of an analog signal processing circuit, especially for a measurement transmitter. A test signal TS is generated at a first test point TP1 and an associated response signal RS tapped at a second test point TP2 and evaluated in a digital unit. In the evaluation, individual amplitude values of the response signal RS are compared with predetermined, desired values. In the case of significant deviations, a defect report is generated.
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