发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method without causing dispersion of channel resistance in order to eliminate dispersion of on-resistance of a DMOS transistor. <P>SOLUTION: After a first body region is formed on a semiconductor substrate, a gate electrode film is laminated on a gate oxide film. Photoresist is used as a mask to form a second body region, and an opening is formed. In this invention, impurity ions are implanted into the opening while the photoresist is left, and the second body region constituting a channel region is formed. In addition, a first source region is formed using the same mask. Next, a gate electrode is formed, a side spacer is formed, and thereafter a second source region and a drain region are formed at the same time. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011100913(A) 申请公布日期 2011.05.19
申请号 JP20090255862 申请日期 2009.11.09
申请人 NEW JAPAN RADIO CO LTD 发明人 NISHIZAWA TOSHIOMI
分类号 H01L29/78 主分类号 H01L29/78
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