发明名称 ENERGY DISCRIMINATION INSPECTION DEVICE FOR HIGH-ENERGY X-RAYS, AND DETECTION METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an energy discrimination inspection device for high-energy X-rays, capable of performing energy discrimination of high-energy X-rays exceeding 1 MeV and generating pileup which is less apt to occur, even if high-energy X-ray pulses are generated, and to provide a detection method. <P>SOLUTION: The energy discrimination inspection device includes an X-ray generating apparatus 11 irradiating an inspection object 6 with high-energy X-rays 1a exceeding 1 MeV; a scattering body 12 Compton scattering incident X-rays 1, transmitted through the inspection object and incident thereon; a shielding body 13 limiting a scattering angle of the Compton scattered X-rays 2, relative to the incident X-rays to a prescribed range; a scattered X-ray detector 14 detecting an energy spectrum of the scattered X-rays limited by the shielding body; and an incident X-ray analyzer 16 operating an energy spectrum of the incident X-rays from the energy spectrum of the scattered X-rays. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011099697(A) 申请公布日期 2011.05.19
申请号 JP20090252942 申请日期 2009.11.04
申请人 IHI CORP 发明人 NOSE HIROYUKI;KUWABARA HAJIME
分类号 G01T1/36;G01N23/04;G01T1/24 主分类号 G01T1/36
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