发明名称 Particle state and flux sensor
摘要 A method of measuring parameters of a particle includes providing a particle, wherein the particle has a first portion and a second portion. The process includes providing a column of photo-detectors including a first photo-detector and a second photo-detector, wherein the first photo-detector and the second photo-detector are sensitive to the same range of light frequencies. Light is projected from the particle onto the column of photo-detectors wherein the column of photo-detectors is oriented so the light from the first portion is projected onto the first photo-detector and light from the second portion is projected onto the second photo-detector. Light measured by the first photo-detector differs from light measured by the second photo-detector. The process further includes using the different first and the second photo-detector measurements to determine at least one from the group consisting of particle temperature and particle diameter.
申请公布号 US8013994(B1) 申请公布日期 2011.09.06
申请号 US20080008787 申请日期 2008.01.14
申请人 CYBER MATERIALS LLC 发明人 VATTIAT BRIAN LOUIS;WROBLEWSKY DONALD EDWARD;GEVELBER MICHAEL ALAN
分类号 G01N15/02 主分类号 G01N15/02
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