发明名称 MICROMETER-SCALE OR NANOMETER=SCALE SPATIALLY CONTROLLED INCORPORATION OF PARTICLES IN A CONDUCTING SURFACE LAYER OF A SUPPORT
摘要 A process for incorporating one or more particles in a conducting or semiconducting surface layer of a surface layer of the support, which comprises the steps of positioning one or more particles on the surface of the conducting surface layer and applying an electrical potential between the surface of the conducting surface layer and a second conducting surface, in an environment that contains an electrolyte, producing a modification of the chemical and/or physical state of the surface layer of the support and/or of the surface of the surface layer of the support and/or of the particle and incorporation of the particle or particles on the surface of the surface layer of the support.
申请公布号 US2011240478(A1) 申请公布日期 2011.10.06
申请号 US20090998258 申请日期 2009.09.25
申请人 CAVALLINI MASSIMILIANO;ALBONETTI CRISTIANO 发明人 CAVALLINI MASSIMILIANO;ALBONETTI CRISTIANO
分类号 C25D15/00;B82Y40/00 主分类号 C25D15/00
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