发明名称 X-RAY FLUORESCENCE ANALYZING METHOD
摘要 An X-ray fluorescence analyzing method includes irradiating a liquid sample (3A) containing hydrogen and at least one element of carbon, oxygen and nitrogen with primary X-rays (2); measuring the intensity F of fluorescent X-rays (4) from each of elements in the sample (3A) and having the atomic number 9 to 20, and the intensity S of scattered X-rays (12) from the sample (3A) caused by continuous X-rays in the primary X-rays; and calculating the concentration of each of the elements, based on the ratio between the measured intensity F, and the measured intensity S. The wavelength of the scattered X-rays (12) is so chosen as to be shorter than that of the fluorescent X-rays (4) and is so set that the measured intensity S and the mass absorption coefficient thereof are inversely proportional to each other within the range of variation of a composition of the sample (3A).
申请公布号 US2011243301(A1) 申请公布日期 2011.10.06
申请号 US201013123121 申请日期 2010.07.01
申请人 RIGAKU CORPORATION 发明人 WATANABE KENJI;KATAOKA YOSHIYUKI;YAMADA YASUJIRO;MORIKAWA ATSUSHI
分类号 G01N23/223;G01N23/203 主分类号 G01N23/223
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