发明名称 PAD CONDITIONER HAVING REDUCED FRICTION AND METHOD OF MANUFACTURING THE SAME
摘要 This invention relates to a conditioner for a chemical mechanical planarization pad, which is necessary for global planarization of a wafer in order to increase the degree of integration of a semiconductor device, and more particularly to a pad conditioner having a structure able to reduce friction with a pad so as to solve the problems caused by a lot of friction being generated upon conditioning, and to a method of manufacturing the same.
申请公布号 US2011250826(A1) 申请公布日期 2011.10.13
申请号 US201113081981 申请日期 2011.04.07
申请人 EHWA DIAMOND IND. CO., LTD. 发明人 YOON SO YOUNG;LEE JOO HAN;LEE JONG JAE
分类号 B24B53/12;B24D3/00;B24D18/00 主分类号 B24B53/12
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