发明名称 Method of manufacturing devices having vertical junction edge
摘要 Techniques for forming devices, such as transistors, having vertical junction edges. More specifically, shallow trenches are formed in a substrate and filled with an oxide. Cavities may be formed in the oxide and filled with a conductive material, such a doped polysilicon. Vertical junctions are formed between the polysilicon and the exposed substrate at the trench edges such that during a thermal cycle, the doped polysilicon will out-diffuse doping elements into the adjacent single crystal silicon advantageously forming a diode extension having desirable properties.
申请公布号 US8084322(B2) 申请公布日期 2011.12.27
申请号 US20060440260 申请日期 2006.05.24
申请人 GONZALEZ FERNANDO;MOULI CHANDRA;MICRON TECHNOLOGY, INC. 发明人 GONZALEZ FERNANDO;MOULI CHANDRA
分类号 H01L21/8242;H01L21/225;H01L21/336;H01L21/8234;H01L21/8238;H01L29/76;H01L29/78 主分类号 H01L21/8242
代理机构 代理人
主权项
地址