ASCERTAINMENT OF DEFOCUSED REFLECTION MAPS FOR THE ROBUST DETERMINATION OF SHAPE FROM FOCUS IN MICROSCOPY IMAGES

摘要

Method for compensating for illumination deficits in microscopic "Shape from Focus (SFF)", wherein first the reflectivity of the scene is estimated using a projector camera system, and then microscopic "Shape from Focus (SFF)" is applied to a stack of reflection maps rather than to the original image data.