| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve the problem in a conventional technology that the need for correcting a degraded accuracy of output voltage due to variations in manufacturing incurs an increase in test cost or in circuit scale. <P>SOLUTION: A semiconductor integrated circuit device includes a DA converter for converting a digital signal in n digits (n is a positive integer equal to or greater than 2) into a voltage signal. In the semiconductor integrated circuit device, the respective DA converters correspond to each bit in the digital signal, and include n pieces of voltage generation elements to generate the voltage signal according to the digital signal. The voltage generated by a voltage generation element corresponding to the k'th digit of bits (k≤n) from the least significant digit of the n pieces of voltage generation elements is lower than the voltage generated by a k-1 voltage generation element corresponding to the k-1'th digit of bits from the least significant digit plus a voltage equal to a first prescribed value. <P>COPYRIGHT: (C)2012,JPO&INPIT |
