| 摘要 |
The invention relates to electronic engineering for high-precision measurement of properties of films of superconducting materials and can be used in the manufacture of superconducting films with well-defined parameters.The device for high-precision measurement of critical temperature of superconducting samples includes a heat exchanger (1), connected through a holder (2) to a vacuum chamber (4), in which are placed a sample (6) and a thermometer (3). The chamber (4) is equipped with a conical cover (5), in which is made a through channel (7), whereby the chamber (4) is connected to a vacuum pump (8). The holder (2), the vacuum chamber (4) and the cover (5) are made of copper.The technical result is to increase the accuracy of measurement of critical temperature of superconducting samples.
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