发明名称 Transistors with metal gate and methods for forming the same
摘要 A semiconductor device includes at least one first gate dielectric layer over a substrate. A first transition-metal oxycarbide (MCxOy) containing layer is formed over the at least one first gate dielectric layer, wherein the transition-metal (M) has an atomic percentage of about 40 at. % or more. A first gate is formed over the first transition-metal oxycarbide containing layer. At least one first doped region is formed within the substrate and adjacent to a sidewall of the first gate.
申请公布号 US8198685(B2) 申请公布日期 2012.06.12
申请号 US20080343307 申请日期 2008.12.23
申请人 LIU CHUNG-SHI;CHIU YUNG-SHENG;LIN CHENG-TUNG;YU CHEN-HUA;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 LIU CHUNG-SHI;CHIU YUNG-SHENG;LIN CHENG-TUNG;YU CHEN-HUA
分类号 H01L27/092;H01L21/28 主分类号 H01L27/092
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