| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method and system for measuring the surface temperature in which the quickly changing surface temperature of the surface to be measured can be correctly measured without using an expensive optical element and also without being affected by the emissivity distribution of the surface to be measured. <P>SOLUTION: In the method and system for measuring the surface temperature, the surface to be measured having the emissivity distribution, a radiometer to measure the brightness distribution of the surface to be measured, and an auxiliary heat source installed at a mirror surface reflection position from the radiometer regarding the surface to be measured are prepared, brightness of two points different in the emissivity of the surface to be measured are measured at two different auxiliary heat source temperatures, the reflectance ratio of two points having different emissivity is calculated based on respective two brightness measurement values of two points having different emissivity, and the temperature of the surface to be measured is obtained by using the brightness measurement values and the reflectance ratio of two points having different emissivity. <P>COPYRIGHT: (C)2012,JPO&INPIT |
