| 摘要 |
<p>A new three-dimensional measurement method based on wavelet transform to solve the phase distribution of a fringe pattern accurately and obtain three-dimensional profile information of a measured object from phase distribution. The method includes: projecting a monochrome sinusoidal fringe pattern onto the object; performing wavelet transform for the deformed fringe pattern acquired with CCD line by line, solving the relative phase distribution by detecting the wavelet ridge line, recording the wavelet transform scale factors at the line, and creating a quality map; dividing the relative phase distribution into two parts according to the map, and performing direct-phase unwrapping for the part with better reliability using a scan line based algorithm, and unwrapping the part with lower reliability using a flood algorithm under the guide of the quality map, to obtain the absolute phase distribution of the fringe pattern; obtaining the three dimensional information using a phase-height conversion.</p> |
