发明名称 Method for fabricating a via hole and through interconnection having via hole
摘要 A method for fabricating a via hole includes forming a first mask pattern on a first surface of a wafer exposing a portion of the first surface of the wafer, forming a passivation region within the wafer by implanting impurities into the exposed portion of the wafer using the first mask pattern as an ion implantation barrier layer, forming an etching stop layer on the first surface of the wafer including the passivation regions, forming a second mask pattern on a second surface of the wafer faces away from the first surface of the wafer, wherein the second mask pattern exposes a portion of the second surface of the wafer over an area between the passivation regions, and forming a via hole by etching the wafer using the second mask pattern as an etching mask.
申请公布号 KR101163223(B1) 申请公布日期 2012.07.06
申请号 KR20100115715 申请日期 2010.11.19
申请人 发明人
分类号 H01L21/60;H01L23/12;H01L23/48 主分类号 H01L21/60
代理机构 代理人
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