发明名称 THOMSON SCATTERING DIAGNOSTIC DATA PROCESSING SYSTEM BY USING EPICS BASED STANDARD FRAMEWORK
摘要 PURPOSE: A Thomson scattering diagnostic system data processing unit in which a standard framework based on EPICS(Experimental Physics and Industrial Control System) is mounted is provided to accurately detect a temperature of a plasma of a superconduction tokamak device on a real time basis and to preciously obtain state information of the plasma. CONSTITUTION: A Thomson scattering diagnostic system data processing unit in which a standard framework based on EPICS is mounted comprises a VME(Versa Module Eurocard) bus rack(400) and a data processing device. A digitizer module is mounted on the VME bus rack. The digitizer module receives electrical signals supplied by a Thomson scattering diagnostic system and the data processing unit of a superconduction tokamak device. An application program in which local timing board device and a standard frame work are used is mounted on the data processing device. Pure Thomson scattering diagnostic data signals are obtained by using electrical signals supplied by the Thomson scattering diagnostic system and synchronized gate signals and a temperature of a plasma is calculated by comparing the obtained data and a look-up table.
申请公布号 KR20120074687(A) 申请公布日期 2012.07.06
申请号 KR20100136602 申请日期 2010.12.28
申请人 KOREA BASIC SCIENCE INSTITUTE 发明人 LEE, WOONG RYOL;PARK, MI KYUNG
分类号 G01K7/00;H05H1/00 主分类号 G01K7/00
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