| 摘要 |
PURPOSE: A pattern inspecting apparatus and method of a light guide plate are provided to accurately inspect defect of a pattern by taking a photograph of only the upper side of the light guide plate. CONSTITUTION: A pattern inspecting apparatus of a light guide plate comprises a light projecting unit(120) and a camera(130). The light projecting unit is arranged at the upper side of the light guide plate while forming a constant angle with the light guide plate. The light projecting unit irradiates the light guide plate with light. The light projecting unit is composed of an LED and a light condensing lens. The camera is perpendicularly arranged with the upper side of the light guide plate. The camera takes a photograph of the light which is reflected from the light guide plate. |
