| 摘要 |
<p>The device has control units metallizing interconnection metallized holes or vias of a printed circuit. The control units comprise a testing circuit (11) comprising crosspieces (12) that represent the metallized holes of the printed circuit, where the crosspieces are connected to each other by less electric resistance metal connections (13) to form a Daisy Chain whose impedance is weak compared to a predetermined impedance. The control units comprise measurement functions (16) measuring an electric resistance of a chain of the crosspieces of the testing circuit.</p> |
