发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device and a manufacturing method of the same, capable of suppressing a short circuit caused by migration and increasing bump arrangement density while maintaining a margin against displacement of a bump or lead wiring. <P>SOLUTION: The semiconductor device comprises: a plurality of electronic devices 4; a plurality of bumps 3; and lead wiring 5 for connecting electronic devices 4 and bumps 3. The bumps 3 are constituted of first bumps 3 and second bumps 3. The first bumps 3 and the second bumps 3 are formed zigzag in a direction in which the electronic devices 4 are arranged. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012151269(A) 申请公布日期 2012.08.09
申请号 JP20110008621 申请日期 2011.01.19
申请人 SEIKO EPSON CORP 发明人 FURUKAWA RYOTA
分类号 H01L21/60 主分类号 H01L21/60
代理机构 代理人
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