发明名称 |
PATTERN FORMING METHOD, METHOD FOR MANUFACTURING MAGNETIC RECORDING MEDIUM AND METHOD FOR MANUFACTURING LSI |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a pattern forming method and a method for manufacturing a magnetic recording medium capable of shortening the time required for forming a pattern. <P>SOLUTION: A resist is coated on a substrate on which a hard mask is deposited to form a resist pattern and the hard mask is etched using the resist pattern as a mask to form a hard mask pattern. A resist is coated on the hard mask and electron beam lithography is performed to form a second resist pattern. The hard mask is etched using the second resist pattern as a mask to form a second hard mask pattern. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012155015(A) |
申请公布日期 |
2012.08.16 |
申请号 |
JP20110012128 |
申请日期 |
2011.01.24 |
申请人 |
TOSHIBA CORP |
发明人 |
OGASAWARA MUNEHIRO |
分类号 |
G03F7/20;B29C59/02;G11B5/84;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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