PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING APPARATUS

摘要

A PROBE ASSEMBLY (18) FOR USE IN ELECTRICAL MEASUREMENT OF A DEVICE UNDER TEST (26). THE PROBE ASSEMBLY COMPRISES A PLATE-LIKE PROBE BASE PLATE (18A) WITH BENDING DEFORMATION PRODUCED IN A FREE STATE WITHOUT LOAD, AND A PLURALITY OF PROBES (18B) FORMED ON ONE FACE (36B) OF THE PROBE BASE PLATE (18A) TO PROJECT FROM THE FACE (36B). ALL THE TIPS OF THE PROBES (18B) ARE POSITIONED ON THE SAME PLANE (P2) PARALLEL TO AN IMAGINARY REFERENCE PLANE (P) OF THE PROBE BASE PLATE (18A).