| 摘要 |
<P>PROBLEM TO BE SOLVED: To perform automatic focusing with high accuracy without being influenced by the quantity of light that irradiates a sample for taking an image. <P>SOLUTION: In a microscope device, a first optical system 107 that is irradiated with light from a first light source 105 and a second light source 106, and irradiates light having a spectrum in which a first spectrum and a second spectrum overlap; a third optical system 110 which is irradiated with light from a second optical system 109, splits into light having a first wavelength region and light having a second wavelength region and emits the split light; an imaging section 112 on which the light having the first wavelength region emitted from the third optical system 110 is incident, and which takes an image of a sample slide 101 due to the light having the first wavelength region; and an AF section 114 on which the light having the second wavelength region emitted from the third optical system 110 is incident, and which focuses the imaging section 112 by adjusting a stage 102 or the second optical system 109 according to at least a part of contrast of the image of the sample slide 101 due to the light having the second wavelength region. <P>COPYRIGHT: (C)2012,JPO&INPIT |
