发明名称 Sacrificial Wafer Probe Pads Through Seal Ring for Electrical Connection to Circuit Inside an Integrated Circuit
摘要 The disclosure is directed to a semiconductor wafer, integrated circuit product, and method of making same, having multiple non-singulated chips separated by scribe lines, comprising a plurality of seal rings, each seal ring surrounding a corresponding chip and disposed between the corresponding chip and adjacent scribe lines. Well resistors are disposed below the seal rings and probe pads disposed in the scribe lines. In particular, at least one of the probe pads is coupled by at least one of the well resistors to at least one of the chips.
申请公布号 US2012326146(A1) 申请公布日期 2012.12.27
申请号 US201113167152 申请日期 2011.06.23
申请人 HUI FRANK;KISTLER NEAL;BAUTISTA DON;BROADCOM CORPORATION 发明人 HUI FRANK;KISTLER NEAL;BAUTISTA DON
分类号 H01L23/58;H01L21/02;H01L29/86 主分类号 H01L23/58
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