发明名称 Semiconductor substrate with solid phase epitaxial regrowth with reduced depth of doping profile and method of producing same
摘要 Method of producing a semiconductor device, comprising: a) providing a semiconductor substrate, b) providing an insulating layer on a top surface of the semiconductor substrate, c) making an amorphous layer in a top layer of said semiconductor substrate by a suitable implant, d) implanting a dopant into said semiconductor substrate through said insulating layer to provide said amorphous layer with a predetermined doping profile, said implant being performed such that said doping profile has a peak value located within said insulating layer, e) applying a solid phase epitaxial regrowth action to regrow said amorphous layer and activate said dopant.
申请公布号 US8357595(B2) 申请公布日期 2013.01.22
申请号 US20040596603 申请日期 2004.12.10
申请人 IMEC;PAWLAK BARTLOMIEJ J. 发明人 PAWLAK BARTLOMIEJ J.
分类号 H01L21/20;H01L21/265;H01L21/336;H01L29/78 主分类号 H01L21/20
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