发明名称 MEASUREMENT DEVICE, MEASUREMENT METHOD, AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To select an equivalent circuit mode more simply and more quickly. <P>SOLUTION: A frequency characteristic measurement controlling unit 52 controls a measurement unit to measure an impedance and phase of a sample, and obtains the measurement values. A determination unit 53 determines whether there is a local maximum or local minimum in the measured impedance. An equivalent circuit mode selection unit 54 selects the equivalent circuit mode with which the measurement is conducted by using the equivalent circuit model exhibiting the equivalent circuit of the sample, on the basis of the determination result. The technology is applicable to a measurement device. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013044722(A) 申请公布日期 2013.03.04
申请号 JP20110185052 申请日期 2011.08.26
申请人 HIOKI EE CORP 发明人 TANAKA HIDEAKI;HARUHARA MASASHI;YAMAGUCHI TSUTOMU
分类号 G01R27/02 主分类号 G01R27/02
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