发明名称 TEST DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a test device capable of testing a plurality of oscillators in parallel. <P>SOLUTION: The test device includes: a signal output circuit 10 for outputting an output signal S with temporal frequency distribution; a first terminal 21 which when a first oscillator 101 is connected thereto, outputs the output signal S to the first oscillator 101; and a second terminal 22 which when a second oscillator 102 is connected thereto, outputs the output signal S to the second oscillator 102. A frequency distribution range of the output signal S is a range in which inherent oscillation frequencies of the first oscillator 101 and the second oscillator 102 are included. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013044656(A) 申请公布日期 2013.03.04
申请号 JP20110183051 申请日期 2011.08.24
申请人 SEIKO EPSON CORP 发明人 WATANABE TORU
分类号 G01M99/00;B81C99/00;G01N5/02 主分类号 G01M99/00
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