<p>PURPOSE: A semiconductor device including a TSV is provided to increase mechanical strength by performing a front etching process. CONSTITUTION: A line layer(130) is formed on the upper surface of a substrate(110). A penetration silicon via passes through the substrate. The via is electrically connected to the line layer. The lower end of the via is protruded from the lower surface of the substrate. The lateral surface of the lower end part is covered with silicon.</p>
申请公布号
KR20130054005(A)
申请公布日期
2013.05.24
申请号
KR20110119772
申请日期
2011.11.16
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, SEOK HO;CHOI, GIL HEYUN;PARK, BYUNG LYUL;CHUNG, HYUN SOO;SHIN, CHANG WOO;PHEE, JAE HYUN;PARK, YEUN SANG