发明名称 |
SEMICONDUCTOR STRUCTURE INCLUDING GATE ELECTRODE HAVING LATERALLY VARIABLE WORK FUNCTION |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor structure including a gate electrode having a laterally variable work function. <P>SOLUTION: A semiconductor structure, such as a CMOS structure, includes a gate electrode that has a laterally variable work function. The gate electrode that has the laterally variable work function may be formed using an angled ion implantation method or a sequential layering method. The gate electrode that has the laterally variable work function provides enhanced electrical performance for an undoped channel field effect transistor device. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013123066(A) |
申请公布日期 |
2013.06.20 |
申请号 |
JP20130009396 |
申请日期 |
2013.01.22 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
KOESTER STEVEN JOHN;AMLAN MAJUMDAR;HAENSCH WILFRIED ERNST-AUGUST |
分类号 |
H01L29/786;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L29/423;H01L29/49;H01L29/78 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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