发明名称 SEMICONDUCTOR STRUCTURE INCLUDING GATE ELECTRODE HAVING LATERALLY VARIABLE WORK FUNCTION
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor structure including a gate electrode having a laterally variable work function. <P>SOLUTION: A semiconductor structure, such as a CMOS structure, includes a gate electrode that has a laterally variable work function. The gate electrode that has the laterally variable work function may be formed using an angled ion implantation method or a sequential layering method. The gate electrode that has the laterally variable work function provides enhanced electrical performance for an undoped channel field effect transistor device. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013123066(A) 申请公布日期 2013.06.20
申请号 JP20130009396 申请日期 2013.01.22
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 KOESTER STEVEN JOHN;AMLAN MAJUMDAR;HAENSCH WILFRIED ERNST-AUGUST
分类号 H01L29/786;H01L21/336;H01L21/8238;H01L27/08;H01L27/092;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L29/786
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