发明名称 HAFNIUM TANTALUM TITANIUM OXIDE FILMS
摘要 Embodiments of a dielectric layer containing a hafnium tantalum titanium oxide film structured as one or more monolayers include the dielectric layer disposed in a transistor. An embodiment may include forming a hafnium tantalum titanium oxide film using a monolayer or partial monolayer sequencing process such as reaction sequence atomic layer deposition.
申请公布号 US2013224916(A1) 申请公布日期 2013.08.29
申请号 US201313849970 申请日期 2013.03.25
申请人 MICRON TECHNOLOGY, INC.;MICRON TECHNOLOGY, INC. 发明人 AHN KIE Y.;FORBES LEONARD
分类号 H01L29/66 主分类号 H01L29/66
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