发明名称 |
SCAN TEST CIRCUIT, TEST PATTERN GENERATION CONTROL CIRCUIT, AND SCAN TEST CONTROL METHOD |
摘要 |
To improve a delay fault coverage without increasing an area overhead, provided is a scan test circuit including: scan flip-flops forming a clock domain that operates according to the same clock within a semiconductor integrated circuit including a target of a delay fault test; a test pattern generation mode control unit (scan flip-flop) that is supplied with the same clock as that supplied to the scan flip-flops, and selects one of a skewed-load mode and a broadside mode as a test pattern generation mode of the delay fault test; and a scan enable signal output unit (OR gate) that outputs a first scan enable signal, which is determined based on the test pattern generation mode, to the scan flip-flops.
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申请公布号 |
US2013254609(A1) |
申请公布日期 |
2013.09.26 |
申请号 |
US201313842370 |
申请日期 |
2013.03.15 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
YONETOKU HIROFUMI;YAMADA NORIHIRO |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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