发明名称 |
Display device and method of measuring surface structure thereof |
摘要 |
A display device and a method of measuring a surface structure of the same are provided. The display device includes first and second substrates, first and second patterned light-shielding layers, and first and second pixel units. The first patterned light-shielding layer disposed on a surface of the first substrate includes first openings. The second patterned light-shielding layer disposed on the surface of the first substrate in the first patterned light-shielding layer includes second openings. The first pixel unit includes first and second protrusions. The first protrusion correspondingly covers the first openings and a portion of the first patterned light-shielding layer. The second protrusion is disposed in the first and second patterned light-shielding layers. The second pixel unit includes a third protrusion correspondingly covering the second openings and a portion of the second patterned light-shielding layer, wherein sizes of the second openings are smaller than sizes of the first openings. |
申请公布号 |
US8605235(B2) |
申请公布日期 |
2013.12.10 |
申请号 |
US20100779915 |
申请日期 |
2010.05.13 |
申请人 |
LIN CHIH-WEI;WANG MIN-CHENG;CHEN YUNG-CHENG;LIU HUNG-MIN;CHUNGHWA PICTURE TUBES, LTD. |
发明人 |
LIN CHIH-WEI;WANG MIN-CHENG;CHEN YUNG-CHENG;LIU HUNG-MIN |
分类号 |
G02F1/1335 |
主分类号 |
G02F1/1335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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