发明名称 Dual-Port Measurements of Light Reflected from Micromirror Array
摘要 An imaging system and method that captures compressive sensing (CS) measurements of a received light stream, and also obtains samples of background light level (BGLL). The BGLL samples may be used to compensate the CS measurements for variations in the BGLL. The system includes: a light modulator to spatially modulate the received light stream with spatial patterns, and a lens to concentrate the modulated light stream onto a light detector. The samples of BGLL may be obtained in various ways: (a) injecting calibration patterns among the spatial patterns; (b) measuring complementary light reflected by digital micromirrors onto a secondary output path; (c) separating and measuring a portion of light from the optical input path; (d) low-pass filtering the CS measurements; and (e) employing a light power meter with its own separate input path. Also, the CS measurements may be high-pass filtered to attenuate background light variation.
申请公布号 US2014009638(A1) 申请公布日期 2014.01.09
申请号 US201314017834 申请日期 2013.09.04
申请人 INVIEW TECHNOLOGY CORPORATION 发明人 BARANIUK RICHARD G.;KELLY KEVIN F.;BRIDGE ROBERT F.;CHATTERJEE SUJOY;MCMACKIN LENORE
分类号 H04N5/238 主分类号 H04N5/238
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