发明名称 |
IMAGE INSPECTION APPARATUS, IMAGE INSPECTION SYSTEM AND IMAGE INSPECTION METHOD |
摘要 |
An image inspection apparatus for inspecting a scanned image of an output image includes an inspection reference image generator to generate an inspection reference image; an image inspection unit to determine a defect by comparing a difference between the inspection reference image and the scanned image with a threshold; a threshold determiner to determine the threshold; and a defect range determiner to determine a range of defect level of a plurality of artificial defects. Based on a difference computed for a defect selected from the plurality of artificial defects, the threshold determiner determines a threshold to be compared with the difference of the selected defect. The defect range determiner conducts a defect determination for the scanned image at the upper and lower limits for a threshold to determine a range of defect level of the plurality of artificial defects. |
申请公布号 |
US2014079292(A1) |
申请公布日期 |
2014.03.20 |
申请号 |
US201314018496 |
申请日期 |
2013.09.05 |
申请人 |
KANEKO HITOMI;KITAI TADASHI;RICOH COMPANY, LTD. |
发明人 |
KANEKO HITOMI;KITAI TADASHI |
分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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