发明名称 IMAGE INSPECTION APPARATUS, IMAGE INSPECTION SYSTEM AND IMAGE INSPECTION METHOD
摘要 An image inspection apparatus for inspecting a scanned image of an output image includes an inspection reference image generator to generate an inspection reference image; an image inspection unit to determine a defect by comparing a difference between the inspection reference image and the scanned image with a threshold; a threshold determiner to determine the threshold; and a defect range determiner to determine a range of defect level of a plurality of artificial defects. Based on a difference computed for a defect selected from the plurality of artificial defects, the threshold determiner determines a threshold to be compared with the difference of the selected defect. The defect range determiner conducts a defect determination for the scanned image at the upper and lower limits for a threshold to determine a range of defect level of the plurality of artificial defects.
申请公布号 US2014079292(A1) 申请公布日期 2014.03.20
申请号 US201314018496 申请日期 2013.09.05
申请人 KANEKO HITOMI;KITAI TADASHI;RICOH COMPANY, LTD. 发明人 KANEKO HITOMI;KITAI TADASHI
分类号 G06T7/00 主分类号 G06T7/00
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