发明名称 RF LDMOS DEVICE AND METHOD OF FORMING THE SAME
摘要 A radio frequency (RF) laterally diffused metal oxide semiconductor (LDMOS) device is disclosed, which includes: a gate structure on a surface of a substrate; and a source region and a drain region beneath the surface of the substrate, the source region and the drain region formed on opposite sides of the gate structure, wherein the gate structure includes a first section proximal to the source region and a second section proximal to the drain region, and wherein the first section of the gate structure has a dopant concentration at least one decimal order higher than a dopant concentration of the second section of the gate structure. A method of forming an RF LDMOS device is also disclosed. With the gate structure including two sections having different dopant concentrations, the present invention is capable of reducing the hot carrier injection effect while possessing a low on-resistance.
申请公布号 US2014159153(A1) 申请公布日期 2014.06.12
申请号 US201314099171 申请日期 2013.12.06
申请人 SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING CORPORATION 发明人 QIAN Wensheng
分类号 H01L29/49;H01L29/66;H01L29/78 主分类号 H01L29/49
代理机构 代理人
主权项 1. A radio frequency (RF) laterally diffused metal oxide semiconductor (LDMOS) device comprising: a gate structure on a surface of a substrate; and a source region and a drain region beneath the surface of the substrate, the source region and the drain region formed on opposite sides of the gate structure, wherein the gate structure comprises a first section proximal to the source region and a second section proximal to the drain region, and wherein the first section of the gate structure has a dopant concentration at least one decimal order higher than a dopant concentration of the second section of the gate structure.
地址 Shanghai CN