| 发明名称 |
METHOD OF DETECTING IRREGULAR CURRENT FLOW IN AN INTEGRATED CIRCUIT DEVICE AND APPARATUS THEREFOR |
| 摘要 |
A method of detecting irregular high current flow within an integrated circuit (IC) device is described. The method comprises obtaining infrared (IR) emission information for the IC device, identifying at least one functional component within the IC device comprising a high current flow, based at least partly on the obtained IR emission information, obtaining IR emission information for at least one reference component within the IC device, and determining whether the high current flow of the at least one functional component comprises an irregular high current flow based at least partly on a comparison of respective IR emission information for the at least one functional component and the at least one reference component. |
| 申请公布号 |
US2015015240(A1) |
申请公布日期 |
2015.01.15 |
| 申请号 |
US201214380738 |
申请日期 |
2012.02.27 |
| 申请人 |
Rozen Anton;Fleshel Leonid;Priel Michael;Weizman Yoav |
发明人 |
Rozen Anton;Fleshel Leonid;Priel Michael;Weizman Yoav |
| 分类号 |
G01N21/66;G01R15/24 |
主分类号 |
G01N21/66 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of detecting irregular high current flow within an integrated circuit (IC) device, the method comprising:
obtaining infrared (IR) emission information for the IC device; identifying at least one functional component within the IC device comprising a high current flow, based at least partly on the obtained IR emission information; obtaining IR emission information for at least one reference component within the IC device; and determining whether the high current flow of the at least one functional component comprises an irregular high current flow based at least partly on a comparison of respective IR emission information for the at least one functional component and the at least one reference component. |
| 地址 |
Gedera IL |
