发明名称 METHOD OF FORMING A DESIRED PATTERN ON A SUBSTRATE
摘要 The present invention relates to a method of forming a desired pattern on a substrate comprising the steps of a) generating an atomic or molecular beam, in particular a beam of He atoms; b) providing a mask having a desired pattern such as a Fourier transform of the desired pattern on the substrate; c) directing the atomic or molecular beam through the patterned mask onto a substrate, whereby a pattern is formed on the substrate by interaction with the proportion of the atomic or molecular beam which penetrates through the mask, which pattern is based on the pattern of the mask, wherein the patterned mask is prepared by a method comprising d) providing a porous starting mask material having openings of a size which allow the atomic or molecular beam to penetrate through; e) creating the desired pattern on the mask by filling a proportion of the openings of the mask which thereby become non-transparent for the atomic or molecular beam. The method of the present invention is useful for preparing conducting circuit structures (micro-chips) or microelectromechanical systems (MEMS) or structures for micro/nano fluidics or nanostructured surfaces in general, ie. hydrophobic or hydrophilic surfaces or reflective/antireflective surfaces.
申请公布号 WO2015011457(A1) 申请公布日期 2015.01.29
申请号 WO2014GB52224 申请日期 2014.07.21
申请人 BERGEN TEKNOLOGIOVERFØRING AS;GOLDING, LOUISE 发明人 HOLST, BODIL
分类号 G03F1/00;G03F1/20;G03F7/20 主分类号 G03F1/00
代理机构 代理人
主权项
地址