| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a sample piece preparing method for preparing a sample piece with less labor and in a short time.SOLUTION: A sample piece preparing method is to fix a sample piece 90, which is cut from a top surface of a sample member 9 disposed on a sample stage, on an observation stage 8, and then to process the sample piece 90 into a shape suitable for microscopic observation. For transferring the sample piece 90, a probe 10 comprising: a body part 11 having a rotation axis 10a; and an inclined part 12 disposed on a tip end of the body part 11 in an inclined state to the rotation axis 10a, is used. When transferring the sample piece 90, the sample piece 90 is held on the tip end of the inclined part 12 in a parallel state to a top surface of a base material 9a in the sample piece 90, the body part 11 is rotated around the rotation axis 10a, then the sample piece 90 is fixed to the observation stage 8 with the same inclination as that of the top surface of the base material 9a of the sample piece 90 when the sample piece 90 was held.</p> |
