发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To improve characteristics of a semiconductor device having a nonvolatile memory.SOLUTION: A semiconductor device is configured to comprise: control gate electrodes CG, memory gate electrodes MG disposed so as to be adjacent to the control gate electrodes CG, insulating films 3, and insulating films 5 each having a charge storage portion in its inside. The memory gate electrodes MG are composed of a silicon film having first silicon regions 6a disposed on the insulating films 5 and second silicon regions 6b disposed above the first silicon regions 6a. The second silicon regions 6b contain a p-type impurity. Concentration of the p-type impurity of the first silicon regions 6a is configured to be lower than that of the second silicon regions 6b.
申请公布号 JP2015026870(A) 申请公布日期 2015.02.05
申请号 JP20140225037 申请日期 2014.11.05
申请人 RENESAS ELECTRONICS CORP 发明人 TOBA KOICHI;ISHII YASUYUKI;CHAGIHARA HIROSHI;FUNAYAMA KOTA;KAWASHIMA YOSHIYUKI;HASHIMOTO KOJI
分类号 H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/336
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