发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To improve characteristics of a semiconductor device having a nonvolatile memory.SOLUTION: A semiconductor device is configured to comprise: control gate electrodes CG, memory gate electrodes MG disposed so as to be adjacent to the control gate electrodes CG, insulating films 3, and insulating films 5 each having a charge storage portion in its inside. The memory gate electrodes MG are composed of a silicon film having first silicon regions 6a disposed on the insulating films 5 and second silicon regions 6b disposed above the first silicon regions 6a. The second silicon regions 6b contain a p-type impurity. Concentration of the p-type impurity of the first silicon regions 6a is configured to be lower than that of the second silicon regions 6b. |
申请公布号 |
JP2015026870(A) |
申请公布日期 |
2015.02.05 |
申请号 |
JP20140225037 |
申请日期 |
2014.11.05 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
TOBA KOICHI;ISHII YASUYUKI;CHAGIHARA HIROSHI;FUNAYAMA KOTA;KAWASHIMA YOSHIYUKI;HASHIMOTO KOJI |
分类号 |
H01L21/336;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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