| 摘要 |
<p>Disclosed is a method for managing infinitesimal defect rate, which is capable of easily sensing a change in a product defect rate that occurs in the production process. The method for managing infinitesimal defect rate comprises the following: a measurement step of selecting a sample from each of the partial groups of produced products during the production process and measuring the quality characteristics of the product; an infinitesimal defect rate calculation step of calculating the infinitesimal defect rate of each sample using the quality characteristics of the sample measured in the measurement step and a predetermined specification limit value of the product; and a defect rate management step of determining whether a problem exists in a defect rate of the produced product when there are one or more values outside the scope of management and when there are one or more values outside the scope of management among the infinitesimal defect rates of an N number of consecutive samples when a predetermined infinitesimal defect rate control chart is compared with the infinitesimal defect rates of the N number of consecutive samples among the samples measured in the measurement step. Therefore, by using the derived infinitesimal defect rate, a change in defect rate of the product can be easily confirmed.</p> |
