| 摘要 |
PROBLEM TO BE SOLVED: To solve problems, for example, when a lattice-state transparent conductive film layer formed of metallic thin wires is used on a leading circuit of a frame part as it is, a resistance value may become higher, so that even conductivity of a portion of the transparent conductive film layer is improved, signal detection speed is not improved, and a transparent conductive film layer on the metallic thin wire and a pattern of a leading circuit are different for every kind of machine according to a size of a display, a method for detecting a signal, and performance of an IC for control circuit, so that a photomask coping with a new pattern must be prepared for every new machine, so that resulting in large cost and labor, and productivity is not improved.SOLUTION: Patterning of the transparent conductive film layer and the leading circuit is performed in other step of forming of the lattice-state transparent conductive film layer formed of metallic thin wires, for solving the problems. |
