发明名称 |
SYSTEM IN A PACKAGE (SiP) |
摘要 |
A system in a package (SiP) includes a first semiconductor die having a nonvolatile memory and trim/repair circuitry, and a second semiconductor die having a volatile memory and trim/repair circuitry. The first and the second semiconductor die are in a same package. The nonvolatile memory of the first semiconductor die is configured to store trim/repair values for each of the first and the second semiconductor die. The trim/repair circuitries of the first and second semiconductor die are configured to, in response to a reset of the second semiconductor die, copy the trim/repair values from the nonvolatile memory of the first semiconductor die to the volatile memory of the second semiconductor die. |
申请公布号 |
US2015179286(A1) |
申请公布日期 |
2015.06.25 |
申请号 |
US201314135387 |
申请日期 |
2013.12.19 |
申请人 |
MILLER GARY L.;Beattie Derek J. |
发明人 |
MILLER GARY L.;Beattie Derek J. |
分类号 |
G11C29/00;G11C14/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
1. A system in a package (SiP), comprising:
a first semiconductor die having a nonvolatile memory and trim/repair circuitry; and a second semiconductor die having a volatile memory and trim/repair circuitry, wherein the first and the second semiconductor die are in a same package, wherein the nonvolatile memory of the first semiconductor die is configured to store trim/repair values for each of the first and the second semiconductor die, and wherein, trim/repair circuitries of the first and second semiconductor die are configured to, in response to a reset of the second semiconductor die, copy the trim/repair values from the nonvolatile memory of the first semiconductor die to the volatile memory of the second semiconductor die. |
地址 |
Austin TX US |