发明名称 SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
摘要 <p>Provided are a substrate processing apparatus capable of executing a plasma treatment using microwaves and a heat treatment by the projection of microwaves for a substrate, and a substrate processing method. The substrate processing apparatus (1) comprises: a processing container (2); a microwave induction device (3) to induce microwaves into the processing container (2); and a placement table (4) to support a wafer (W) inside the processing container (2). The placement table (4) is made of a material capable of transmitting microwaves. A plasma processing space (S1) to execute the plasma treatment for the wafer (W) and a microwave induction space (S2) wherein microwaves are induced are formed in the processing container (2). The microwaves passing through the placement table (4) are used for heating of the wafer (W) by arriving at the plasma processing space (S1) before being consumed by plasma.</p>
申请公布号 KR20150075380(A) 申请公布日期 2015.07.03
申请号 KR20140187248 申请日期 2014.12.23
申请人 TOKYO ELECTRON LIMITED 发明人 SHIMOMURA KOUJI;NORO NAOTAKA;NISHIMURA EIICHI
分类号 H01L21/02;H01L21/205;H01L21/3065;H01L21/324;H05H1/46 主分类号 H01L21/02
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