| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of specifying in a short time an inspection object region of an inspection object hoped to acquire a CT image, while reducing a cost even when an inspection of a relatively larger inspection object is performed, and capable of generating the CT image in a short time after specifying the inspection object region.SOLUTION: An X-ray inspection device 1 acquires a two-dimensional X-ray image of an inspection object 2 by relatively and linearly moving a line sensor 4 for the inspection object 2 disposed between an X-ray generator 3 and a line sensor 4, and relatively moves the X-ray generator 3 and an area sensor 5 for the inspection object 2 so that the inspection object region of the inspection object 2 specified based on the acquired X-ray image is disposed between the X-ray generator 3 and the area sensor 5, and acquires an image of the inspection object region and generates a CT image, while relatively rotating the X-ray generator 3 and the area sensor 5 for the inspection object region on the outer peripheral side of the inspection object region disposed between the X-ray generator 3 and the area sensor 5. |
