发明名称 |
Contact clean by remote plasma and repair of silicide surface |
摘要 |
Embodiments provide methods for treating a metal silicide contact which includes positioning a substrate having an oxide layer disposed on a metal silicide contact surface within a processing chamber, cleaning the metal silicide contact surface to remove the oxide layer while forming a cleaned silicide contact surface during a cleaning process, and exposing the cleaned silicide contact surface to a silicon-containing compound to form a recovered silicide contact surface during a regeneration process. In some examples, the cleaning of the metal silicide contact surface includes cooling the substrate to an initial temperature of less than 65° C., forming reactive species from a gas mixture of ammonia and nitrogen trifluoride by igniting a plasma, exposing the oxide layer to the reactive species to form a thin film, and heating the substrate to about 100° C. or greater to remove the thin film from the substrate while forming the cleaned silicide contact surface. |
申请公布号 |
US9147578(B2) |
申请公布日期 |
2015.09.29 |
申请号 |
US201113004740 |
申请日期 |
2011.01.11 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
Lu Xinliang;Kao Chien-Teh;Lai Chiukin Steve;Chang Mei |
分类号 |
H01L21/00;H01L21/285;H01L21/02;H01L21/28;H01L21/321;H01L29/66 |
主分类号 |
H01L21/00 |
代理机构 |
Patterson & Sheridan, LLP |
代理人 |
Patterson & Sheridan, LLP |
主权项 |
1. A method for treating a metal silicide contact, comprising:
positioning a substrate within a processing chamber, wherein the substrate comprises an oxide layer disposed on a metal silicide contact surface; cleaning the metal silicide contact surface to remove the oxide layer while forming a cleaned silicide contact surface during a cleaning process, comprising:
cooling the substrate to an initial temperature of less than 65° C.;forming reactive species from a gas mixture of ammonia and nitrogen trifluoride by igniting a plasma;exposing the oxide layer to the reactive species to form a thin film; andheating the substrate to an anneal temperature of about 100° C. or greater to remove the thin film from the substrate while forming the cleaned silicide contact surface; exposing the cleaned silicide contact surface to a silicon-containing compound to form a recovered silicide contact surface during a regeneration process, wherein the silicon-containing compound comprises silane or disilane; and depositing one or more barrier layers over the recovered silicide contact surface. |
地址 |
Santa Clara CA US |