发明名称 Contact clean by remote plasma and repair of silicide surface
摘要 Embodiments provide methods for treating a metal silicide contact which includes positioning a substrate having an oxide layer disposed on a metal silicide contact surface within a processing chamber, cleaning the metal silicide contact surface to remove the oxide layer while forming a cleaned silicide contact surface during a cleaning process, and exposing the cleaned silicide contact surface to a silicon-containing compound to form a recovered silicide contact surface during a regeneration process. In some examples, the cleaning of the metal silicide contact surface includes cooling the substrate to an initial temperature of less than 65° C., forming reactive species from a gas mixture of ammonia and nitrogen trifluoride by igniting a plasma, exposing the oxide layer to the reactive species to form a thin film, and heating the substrate to about 100° C. or greater to remove the thin film from the substrate while forming the cleaned silicide contact surface.
申请公布号 US9147578(B2) 申请公布日期 2015.09.29
申请号 US201113004740 申请日期 2011.01.11
申请人 APPLIED MATERIALS, INC. 发明人 Lu Xinliang;Kao Chien-Teh;Lai Chiukin Steve;Chang Mei
分类号 H01L21/00;H01L21/285;H01L21/02;H01L21/28;H01L21/321;H01L29/66 主分类号 H01L21/00
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method for treating a metal silicide contact, comprising: positioning a substrate within a processing chamber, wherein the substrate comprises an oxide layer disposed on a metal silicide contact surface; cleaning the metal silicide contact surface to remove the oxide layer while forming a cleaned silicide contact surface during a cleaning process, comprising: cooling the substrate to an initial temperature of less than 65° C.;forming reactive species from a gas mixture of ammonia and nitrogen trifluoride by igniting a plasma;exposing the oxide layer to the reactive species to form a thin film; andheating the substrate to an anneal temperature of about 100° C. or greater to remove the thin film from the substrate while forming the cleaned silicide contact surface; exposing the cleaned silicide contact surface to a silicon-containing compound to form a recovered silicide contact surface during a regeneration process, wherein the silicon-containing compound comprises silane or disilane; and depositing one or more barrier layers over the recovered silicide contact surface.
地址 Santa Clara CA US