发明名称 |
Semiconductor structure and manufacturing method thereof |
摘要 |
A semiconductor structure includes a substrate and a metal gate. The metal gate includes a metallic filling layer and disposed over the substrate. The semiconductor structure further includes a dielectric material over the metallic filling layer and separating the metallic filling layer from a conductive trace. The conductive trace is over the dielectric material. The semiconductor structure further includes a conductive plug extending longitudinally through the dielectric material and ending with a lateral encroachment inside the metallic filling layer along a direction. The lateral direction is substantially perpendicular to the longitudinal direction of the conductive plug. |
申请公布号 |
US9147767(B2) |
申请公布日期 |
2015.09.29 |
申请号 |
US201414175677 |
申请日期 |
2014.02.07 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
发明人 |
Chen Chien-Hung;Liu Shen-Chieh;Chen Hobin;Wu Wen-Lang;Tsuei Cherng-Chang |
分类号 |
H01L21/338;H01L29/78;H01L29/45;H01L29/51;H01L29/49;H01L29/66;H01L21/311;H01L21/3213;H01L29/423 |
主分类号 |
H01L21/338 |
代理机构 |
WPAT, P.C. |
代理人 |
WPAT, P.C. ;King Anthony |
主权项 |
1. A method of manufacturing a semiconductor structure, comprising:
providing a substrate; forming a silicide region on the substrate; disposing a first dielectric on the substrate; forming a metal gate structure on the substrate; disposing a second dielectric over the metal gate structure and the substrate; performing a first etch in the second dielectric thereby forming a first opening to expose a top surface of a metallic material in the metal gate structure; performing a second etch in the first dielectric thereby forming a second opening to expose the silicide region of the substrate; and performing a wet etch in the first opening to remove a portion of the metallic material from the top surface thereby forming a lateral recess under the second dielectric. |
地址 |
Hsinchu TW |