发明名称 Semiconductor structure and manufacturing method thereof
摘要 A semiconductor structure includes a substrate and a metal gate. The metal gate includes a metallic filling layer and disposed over the substrate. The semiconductor structure further includes a dielectric material over the metallic filling layer and separating the metallic filling layer from a conductive trace. The conductive trace is over the dielectric material. The semiconductor structure further includes a conductive plug extending longitudinally through the dielectric material and ending with a lateral encroachment inside the metallic filling layer along a direction. The lateral direction is substantially perpendicular to the longitudinal direction of the conductive plug.
申请公布号 US9147767(B2) 申请公布日期 2015.09.29
申请号 US201414175677 申请日期 2014.02.07
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. 发明人 Chen Chien-Hung;Liu Shen-Chieh;Chen Hobin;Wu Wen-Lang;Tsuei Cherng-Chang
分类号 H01L21/338;H01L29/78;H01L29/45;H01L29/51;H01L29/49;H01L29/66;H01L21/311;H01L21/3213;H01L29/423 主分类号 H01L21/338
代理机构 WPAT, P.C. 代理人 WPAT, P.C. ;King Anthony
主权项 1. A method of manufacturing a semiconductor structure, comprising: providing a substrate; forming a silicide region on the substrate; disposing a first dielectric on the substrate; forming a metal gate structure on the substrate; disposing a second dielectric over the metal gate structure and the substrate; performing a first etch in the second dielectric thereby forming a first opening to expose a top surface of a metallic material in the metal gate structure; performing a second etch in the first dielectric thereby forming a second opening to expose the silicide region of the substrate; and performing a wet etch in the first opening to remove a portion of the metallic material from the top surface thereby forming a lateral recess under the second dielectric.
地址 Hsinchu TW