发明名称 Apparatus for speckle reduction, pulse stretching, and beam homogenization
摘要 Embodiments described herein relate to thermal processing of semiconductor substrates. More specifically, embodiments described herein relate to laser thermal processing of semiconductor substrates. In certain embodiments, a uniformizer is provided to spatially and temporally decorrelate a coherent light image.
申请公布号 US9146337(B2) 申请公布日期 2015.09.29
申请号 US201314137592 申请日期 2013.12.20
申请人 APPLIED MATERIALS, INC. 发明人 Li Jiping;Hunter Aaron Muir;Adams Bruce E.;Holmgren Douglas E.;Howells Samuel C.;Moffitt Theodore P.;Moffatt Stephen
分类号 G02B27/10;G02B3/00;G02B27/48 主分类号 G02B27/10
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. An apparatus, comprising: a first microlens array in a propagation path of an input energy; a second microlens array in the propogation path of the input energy; and a temporal decorrelator comprising a plurality of fibers positioned between the first microlens array and the second microlens array, wherein the first microlens array and the second microlens array are in physical contact with the temporal decorrelator.
地址 Santa Clara CA US